Author:
Plies Erich,Schweizer Michael
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
9 articles.
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1. Detecting and preventing measurement errors;IEEE Design & Test of Computers;1997
2. Primary electron pulse shape evaluation in an EBT system;IEEE Transactions on Instrumentation and Measurement;1994
3. Signal and Image Processing;Electron Beam Testing Technology;1993
4. High-Speed Techniques;Electron Beam Testing Technology;1993
5. The impulse response of an EBT system;Microelectronic Engineering;1992-03