Assessment of current and optical confinement in operational quantum well laser-Reference-Cited by-同舟云学术

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Assessment of current and optical confinement in operational quantum well laser

Published:1998-08 Issue: Volume:43-44 Page:539-543
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Mil'shtein S,Therrien J.M,Thurkins E.J,Chin A.K,Dabkowski F.P

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. S. Mil'shtein, D. Kharas, S. Iatrou, K. Gray, in: Proc. 22nd Int. Conf. Phys. Semicond. (1995), pp. 2625-2629

2. Measurements of interface potentials in quantum wells

3. S. Mil'shtein, J. Therrien, Patent Appl. No. 08757468, Nov. 27, 1996.

4. S. Mil'shtein, D. Kharas, J. Therrien, A. Chin, F. Dabkowski, in: Proc. 23rd Int. Conf. Phys. Semicond. (1996), pp. 3199–3202

5. J. Therrien, S. Mil'shtein, A. Chin, in: MRS Thin Films, Structure and Morphology (1996), pp. 749–754.

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