Author:
Heiser T.,Istratov A.A.,Flink C.,Weber E.R.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference44 articles.
1. The electrical properties of deep copper‐ and nickel‐related centers in silicon
2. Störstellenreaktionen bei Cu-dotierten Siliziumkristallen
3. K. Graff, H. Pieper, in: H.R. Huff, J. Kriegler, Y. Takeishi (Eds.), Semiconductor Silicon, Electrochemical Society, Pennington, NJ, 1981, p. 331.
4. Defect reactions in copper-diffused and quenchedp-type silicon
Cited by
20 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献