Author:
Gottesman Y.,Pommiès M.,Rao E.V.K.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference7 articles.
1. Reliability and degradation of III–V optical devices;Ueda,1996
2. Low coherence reflectometry and spectral analysis for detection of gain anomalies in semiconductor lasers
3. R. Simes, R.M. Capella, B. Fernier, H.P. Mayer, Leading-Edge laser production using two-inch technology. Proc. 7th IPRM 95, Japan, pp. 10–13
4. K. Kasaya, Y. Yoshikunia, H. Ishii, IEEE Photon. Technol. Letters, Vol 8, n°2, Feb 1996, pp. 251–253,
5. Analysis of distributed feddback lasers using optical low-coherence reflectometry;Wiedmann;Journal of lightwave technology,1998
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献