Long-term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests-Reference-Cited by-同舟云学术

Long-term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests

Published:2005 Issue:6 Volume:21 Page:571-594
ISSN:0748-8017
Container-title:Quality and Reliability Engineering International
language:en
Short-container-title:Qual. Reliab. Engng. Int.

Author:

Deshayes Y.,Bechou L.,Verdier F.,Danto Y.

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Reference57 articles.

1. Reliability and Degradation of Semiconductor Lasers and LEDs. Artech House: London, 1991.

2. Honeywell. Summary of SE450 GaAs:Si IRED chip long-term life study. Technical Datasheet, Honeywell, 1986; 368-376.

3. Optical components-the new challenge in packaging

4. Optoelectronic Integration: Physics, Technology and Application. Kluwer Academic: Boston, MA, 1994.

5. , , . High performance optoelectronic packaging for 2.5 and 10 Gb/s Laser modules. Proceedings of the 46th Electronic Components and Technology Conference, Orlando, FL, 1996; 620-627.

Cited by 30 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An analytical and machine learning model for SPD estimation and its prediction for lumen and chromaticity shift based LED lifetime performance analysis;Physica Scripta;2024-06-21

2. Impact of LED Temperature on the Performance of LiFi Optical Wireless Communication Links;2023 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC);2023-09-27

3. Closed Form Approximation of the Actual Spectral Power Emission of Commercial Color LEDs for VLC;Journal of Lightwave Technology;2022-07-01

4. LED Reliability Assessment Using a Novel Monte Carlo-Based Algorithm;IEEE Transactions on Device and Materials Reliability;2021-09

5. PHM of Light-Emitting Diodes;Prognostics and Health Management of Electronics;2018-08-24