Microwave photoconductivity techniques for the characterization of semiconductors
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference15 articles.
1. An rf bridge technique for contactless measurement of the carrier lifetime in silicon wafers
2. Surface photovoltage phenomena: theory, experiment, and applications
3. Infrared Absorption by Conduction Electrons in Germanium
4. Microwave Techniques in Measurement of Lifetime in Germanium
5. Contactless scanner for photoactive materials using laser‐induced microwave absorption
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