1. See for example, “Lifetime Factors in Silcon,” ASTM STP 712, American Society for Testing and Materials, Philadelphia, 1980.
2. A. G. Milnes and D. L. Feucht,Heterojunctions and Metal Semiconductor Junctions(Academic, New York, 1972).
3. Annual Book of ASTM Standards, Part 43 Electronics, F391-78, American Society for Testing and Materials (1981).
4. A. Rose,Concepts in Photoconductivity and Allied Problems(Krieger, Huntington, New York, 1978).
5. H. S. Carslaw and J. C. Jaegar,Conduction of Heat in Solids2nd ed. (Oxford University, Cambridge, 1976).