X-ray determination of the composition of partially strained group-III nitride layers using the Extended Bond Method
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference21 articles.
1. Precision lattice constant determination
2. X-ray analysis of the texture of heteroepitaxial gallium nitride films
3. Determination of lattice parameters in the epitaxial system by high resolution X-ray diffraction
4. Measurement of aluminum concentration in the Ga1−xAlxSb/GaSb epitaxial system
5. Strain analysis by X-ray diffraction
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