Author:
Fewster Paul F.,Andrew Norman L.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference19 articles.
1. Measurement of non-uniform residual stresses using the hole drilling method, a new integral formalism
2. P.F. Fewster, N.L. Andrew, Microstructure Analysis from Diffraction, IUCr series, Oxford Univ. Press, 1997.
3. M. Sevidori, F. Cembali, S. Milita, X-ray and Neutron Dynamical Diffraction: Theory and Application, in: A. Authier, S. Lagomarisino, B.K. Tanner (Eds.), Plenum, New York, 1997, p. 301.
4. Fitting of rocking curves from ion-implanted semiconductors
5. X-ray Bragg reflexion and strain compensation in silicon crystals
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