Chemical recognition based on high-accuracy matching factors as per time-of-flight–secondary-ion mass spectrometry: Application to trace cosmetic residues in human forensics-Reference-Cited by-同舟云学术

Chemical recognition based on high-accuracy matching factors as per time-of-flight–secondary-ion mass spectrometry: Application to trace cosmetic residues in human forensics

Published:2020-12 Issue: Volume:159 Page:105446
ISSN:0026-265X
Container-title:Microchemical Journal
language:en
Short-container-title:Microchemical Journal

Author:

Terlier Tanguy,Lee Kang-Bong,Lee Yeonhee

Publisher

Elsevier BV

Subject

Spectroscopy,Analytical Chemistry

Reference44 articles.

1. J.C. Vickermann, D. Briggs, TOF-SIMS: materials analysis by mass spectrometry, SurfaceSpectra. Second Ed. Manchester. (2013) 1-37.

2. Surface Analysis of Photolithographic Patterns using ToF-SIMS and PCA;Dubey;Surf. Interface Anal.,2009

3. ToF-SIMS imaging of Cl at Cu grain boundaries in interconnects for microelectronics;Barnes;Appl. Surf. Sci.,2008

4. Unique failure analysis capabilities enabled by the MIP decapsulation technique;Tang,2017

5. Characterization of advanced ALD-based thin film barriers for organic electronics using ToF-SIMS;Terlier;Org. Electron.,2018

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