Chemical recognition based on high-accuracy matching factors as per time-of-flight–secondary-ion mass spectrometry: Application to trace cosmetic residues in human forensics-Reference-Cited by-同舟云学术

Chemical recognition based on high-accuracy matching factors as per time-of-flight–secondary-ion mass spectrometry: Application to trace cosmetic residues in human forensics

Published:2020-12 Issue: Volume:159 Page:105446
ISSN:0026-265X
Container-title:Microchemical Journal
language:en
Short-container-title:Microchemical Journal

Author:

Terlier Tanguy,Lee Kang-Bong,Lee Yeonhee

Publisher

Elsevier BV

Subject

Spectroscopy,Analytical Chemistry

Reference44 articles.

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5. Characterization of advanced ALD-based thin film barriers for organic electronics using ToF-SIMS;Terlier;Org. Electron.,2018

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