Characterization of advanced ALD-based thin film barriers for organic electronics using ToF-SIMS analysis

Author:

Terlier T.ORCID,Maindron T.,Barnes J.-P.ORCID,Léonard D.

Funder

French “Recherches Technologiques de Base”

Nano Characterization Platform (PFNC) of CEA Grenoble

European project (FP7) SCOOP

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Materials Chemistry,Condensed Matter Physics,General Chemistry,Biomaterials,Electronic, Optical and Magnetic Materials

Reference25 articles.

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3. Degradation mechanisms in organic light emitting diodes;Shen;Synth. Met.,2000

4. Metal diffusion from electrodes in organic light-emitting diodes;Lee;Appl. Phys. Lett.,1999

5. Degradation of organic light-emitting devices due to formation and growth of dark spots;Lim;Mater. Sci. Eng., B,2001

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