Comprehensive study of a 4H–SiC MES–MOSFET
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference39 articles.
1. 1330V, 67mΩcm2 4H–SiC (0001) RESURF MOSFET;Kimoto;IEEE Electron Device Lett.,2005
2. Experimental and theoretical investigations on short-channel effects in 4H–SiC MOSFETs;Noborio;IEEE Trans. Electron Devices,2005
3. Off-state Avalanche-breakdown- reduced on-resistance degradation in lateral DMOS transistors;Chen;IEEE Electron Device Lett.,2007
4. A numerical model of Avalanche breakdown in MOSFETs;Toyabe;IEEE Trans. Electron Devices,1978
5. A new buried-oxide-in-drift-region trench MOSFET with improved breakdown voltage;Saxena;IEEE Electron Device Lett.,2009
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