Secondary ion emission enhancement assisted by electron beam in secondary ion mass spectrometry
Author:
Publisher
Elsevier BV
Subject
Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Instrumentation
Reference26 articles.
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Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Penning ionization in the electron beam assisted secondary ion mass spectrometry-dependence of ionization potential;International Journal of Mass Spectrometry;2009-01
2. Current literature in mass spectrometry;Journal of Mass Spectrometry;2009-01
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