Penning ionization in the electron beam assisted secondary ion mass spectrometry-dependence of ionization potential-Reference-Cited by-同舟云学术

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Penning ionization in the electron beam assisted secondary ion mass spectrometry-dependence of ionization potential

Published:2009-01 Issue:2-3 Volume:279 Page:76-81
ISSN:1387-3806
Container-title:International Journal of Mass Spectrometry
language:en
Short-container-title:International Journal of Mass Spectrometry

Author:

Lee Wei-Chiang,Hwang J.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Instrumentation

Reference13 articles.

1. Ultra shallow secondary ion mass spectrometry;Liu;Solid-State Integrated-Circuit Technol.,2001

2. Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends;Benninghoven,1987

3. Secondary ion emission from metal targets under carbon trifluoride ion (CF3+) and oxygen ion (O2+) bombardment

4. Enhanced SIMS analysis performance by CCl4 flooding technique

5. Secondary ion emission enhancement assisted by electron beam in secondary ion mass spectrometry

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Current literature in mass spectrometry;Journal of Mass Spectrometry;2009-07

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