Molecular cluster emission in sputtering of amino acids by argon gas-cluster ions

Author:

Kusakari Masakazu,Gnaser Hubert,Fujii Makiko,Seki Toshio,Aoki Takaaki,Matsuo Jiro

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Instrumentation

Reference58 articles.

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2. TOF-SIMS: Materials Analysis by Mass Spectrometry,2013

3. The magic of cluster SIMS;Winograd;Anal. Chem.,2005

4. Molecular secondary ion formation under cluster bombardment: a fundamental review;Wucher;Appl. Surf. Sci.,2006

5. Cluster secondary ion mass spectrometry of polymers and related materials;Mahoney;Mass Spectrom. Rev.,2010

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1. Positive and negative cluster ions of amino acids formed by electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS);International Journal of Mass Spectrometry;2022-10

2. Silica sputtering by noble gas projectiles: elucidating the effect of cluster species with molecular dynamic simulation;Plasma Chemistry and Plasma Processing;2022-09-21

3. Surface topography and composition of NiPd alloys under oblique and normal gas cluster ion beam irradiation;Surface Science;2020-10

4. Gas cooling secondary ions emitted by gas cluster ion beam at the travelling-wave ion guide of a Q-ToF-SIMS system;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-07

5. Cluster ion beam bombardment and Q-ToF-SIMS analysis of large biomolecules;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-06

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