Analysis of metastable ions in the ToF-SIMS spectra of polymers
Author:
Publisher
Elsevier BV
Subject
Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Instrumentation
Reference17 articles.
1. Static SIMS: metastable decay and peak intensities
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3. A secondary ion time-of-flight mass spectrometer with an ion mirror
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5. Quantitative determination of kinetic energy releases from metastable decompositions of sputtered organic ions using a time-of-flight mass spectrometer with a single-stage ion mirror
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