A secondary ion time-of-flight mass spectrometer with an ion mirror-Reference-Cited by-同舟云学术

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A secondary ion time-of-flight mass spectrometer with an ion mirror

Published:1988-07 Issue:1 Volume:85 Page:43-67
ISSN:0168-1176
Container-title:International Journal of Mass Spectrometry and Ion Processes
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Processes

Author:

Tang X.,Beavis R.,Ens W.,Lafortune F.,Schueler B.,Standing K.G.

Publisher

Elsevier BV

Subject

Spectroscopy

Reference71 articles.

1. A time-of-flight mass spectrometer for measurement of secondary ion mass spectra

2. 252Cf-plasma desorption time-of-flight mass spectrometry

3. Fission fragment ionization mass spectrometry: Metastable decompositions

4. Prompt and metastable decomposition in 252Cf fission fragment ionization mass spectrometry

5. Time-of-Flight Measurements of Cesium-Iodide Cluster Ions

Cited by 119 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Stability of MeV primary ion induced secondary ions;International Journal of Mass Spectrometry;2023-05

2. Kenneth G. Standing (April 3, 1925–March 21, 2019);Journal of the American Society for Mass Spectrometry;2020-05-06

3. Microscope imaging mass spectrometry with a reflectron;Review of Scientific Instruments;2020-02-01

4. The Development of Time-of-Flight Mass Spectrometry;The Encyclopedia of Mass Spectrometry;2016

5. Unveiling the Intricacies of the Curved-Field Ion Mirror;European Journal of Mass Spectrometry;2015-06

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