Process diagnostics and functional correlation in surface metrology: novel techniques, case studies and analysis system development-Reference-Cited by-同舟云学术

Process diagnostics and functional correlation in surface metrology: novel techniques, case studies and analysis system development

Published:2004-09 Issue:2 Volume:36 Page:175-183
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Muralikrishnan B.,Raja J.

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference12 articles.

1. Handbook of surface metrology;Whitehouse,1994

2. Recent advances in separation of roughness, waviness and form

3. B. Muralikrishnan, Advanced surface texture analysis for process diagnostics and functional correlation, Ph.D. dissertation, University of North Carolina at Charlotte, 2003

4. ISO 13565-2, Geometrical product specification (GPS)––Surface texture: profile method, Surfaces having stratified functional properties––Part 2: height characterization using the linear material ratio curve, 1996

5. ISO 13565-3, Geometrical product specification (GPS)––Surface texture: profile method, Surfaces having stratified functional properties––Part 3: height characterization using the material probability curve of surfaces consisting of two vertical random components, 1998

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