Surface quality control device for on-line applications-Reference-Cited by-同舟云学术

Surface quality control device for on-line applications

Published:2008-08 Issue:7 Volume:41 Page:774-782
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Minoni Umberto,Cavalli Fabio

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference13 articles.

1. Process diagnostics and functional correlation in surface metrology: novel techniques, case studies and analysis system development;Muralikrishnan;Measurement,2004

2. Predicting surface roughness in machining: a review;Bernardos;Int. J. Mach. Tool. Manufact.,2003

3. Handbook of Surface Metrology;Whitehouse,1994

4. Surface metrology;Whitehouse;Meas. Sci. Technol.,1997

5. F. Docchio, U. Minoni, R. Rodella, L. Rovati, V. Corallo, Development of an optical sensor for the measurement of surface roughness and waviness, in: Proc. SPIE (3823), 1999, pp. 160–163.

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