Author:
Lou Shan,Jiang Xiangqian,Scott Paul J.
Subject
Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation
Reference34 articles.
1. Technological shifts in surface metrology;Jiang;CIRP Ann. Manuf. Technol.,2012
2. Surface Metrology;Whitehouse,1994
3. Motif combination − a new approach to surface profile analysis;Fahl;Wear,1982
4. The motif method (ISO 12085): a suitable description for functional manufactural and metrological requirements;Dietzsch;Mach. Tools Manuf.,1998
5. CNOMO E00.14.015 N, etats geometriques de surface, calcul des parametres de profil, 1983.
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