“The MOTIF-method (ISO 12085) — a suitable description for functional, manufactural and metrological requirements”-Reference-Cited by-同舟云学术

“The MOTIF-method (ISO 12085) — a suitable description for functional, manufactural and metrological requirements”

Published:1998-05 Issue:5-6 Volume:38 Page:625-632
ISSN:0890-6955
Container-title:International Journal of Machine Tools and Manufacture
language:en
Short-container-title:International Journal of Machine Tools and Manufacture

Author:

Dietzsch -Ing.M.,Papenfuβ K.,T. Hartmann

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Mechanical Engineering

Reference4 articles.

1. ISO 12085:1996. Surface roughness and waviness — Motif method.

2. ISO4287:1996. Geometrical product specification (GPS) — Surface texture; Profile method - Terms,definitionsandsurface texture parameters.

3. Dietzsch, M.; Hartmann, T; Papenfuβ, K.: “The MOTIF-method, a new draft of an ISO-Standard (ISO/DIS 12085) to measure surface roughness and waviness with a stylus instrument”. Third InternationalSymposium on Measurement Technology and Intelligent Instruments - ISMTII'96,page399–405, Hayama Kanagagawa Pref, Japan

4. The MOTIFS-method—An interesting complement to ISO-parameters for some functional problems;Boulanger;Int. J. Mach. Tools Manufac.,1992

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Surface periodicity index (SPI): A measure of periodicity of surface topography;Precision Engineering;2023-01

2. Comparison between the machinability of different titanium alloys (Ti–6Al–4V and Ti–6Al–7Nb) employing the multi-objective optimization;Journal of the Brazilian Society of Mechanical Sciences and Engineering;2021-10-26

3. Modeling detrimental effects of high surface roughness on the fatigue behavior of additively manufactured Ti-6Al-4V alloys;International Journal of Fatigue;2021-03

4. Optimal characterisation of profile features;Surface Topography: Metrology and Properties;2021-01-13

5. Segmentation of topographical features on free-form surfaces;Advanced Metrology;2020