Author:
Dendouga A.,Hafiane M.L.,Bouguechal N.,Oussalah S.,Barra S.,Kouda S.
Subject
Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation
Reference11 articles.
1. Design for testability of embedded integrated operational amplifiers;Arabi;IEEE Journal of Solid-state Circuits,1998
2. Design for testability using behavioral models;George;IEEE Transactions on Instrumental and Measurement,1990
3. K.D. Wagner, T.W. Wiliams, Design for testability of mixed signal integrated circuits, in: Proc. IEEE Int. Test Conf., 1988, pp. 823–829.
4. Built-in self-test structure for analog circuit fault diagnosis;Wey;IEEE Trans. Instrum. Meas.,1990
5. L. Milor, A.S. Vincentelli, Optimal test set design for analog circuits, in: Proc. IEEE ICCAD, 1990, pp. 294–297.
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