Design for testability of embedded integrated operational amplifiers-Reference-Cited by-同舟云学术

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Design for testability of embedded integrated operational amplifiers

Published:1998-04 Issue:4 Volume:33 Page:573-581
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Arabi K.,Kaminska B.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/4/14532/00663562.pdf?arnumber=663562

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