Numerical double integration of acceleration measurements in noise

Author:

Thong Y.K.,Woolfson M.S.,Crowe J.A.,Hayes-Gill B.R.,Jones D.A.

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference15 articles.

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4. Mechanisms of noise sources in microelectromechanical systems;Djurić;Microelectronic Reliability,2000

5. Evaluation of a low-cost MEMS accelerometer for distance measurement;Pang;Journal of Intelligent and Robotic Systems,2001

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