Noise sensitivity of the exponential histogram ADC test-Reference-Cited by-同舟云学术

Noise sensitivity of the exponential histogram ADC test

Published:2006-04 Issue:3 Volume:39 Page:238-244
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Šaliga Ján,Michaeli Linus,Holcer Roland

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference9 articles.

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2. IEEE Std. 1241, IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters, 2000.

3. DYNAD, draft ver. 3.3, 2001. Available from: .

4. Automated ADC characterization using the histogram test stimulated by Gaussian noise;Martins;IEEE Transactions on Instrumentation and Measurement,1999

5. J. Holub, J. Vedral, M. Kubin, Improvement of step-gauss ADC stochastic test method, in: Proceedings of 7th European Workshop EWADC 2002, Prague, Czech republic, June 2002, pp. 115–118.

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