1. IEEE Std. 1057-2007, IEEE Standard for Digitizing Waveform Recorders, Institute of Electrical and Electronics Engineers, Inc., New York, USA, 2008.
2. IEEE Std. 1241-2000, IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters, Institute of Electrical and Electronics Engineers, Inc., New York, USA, 2000.
3. CEI IEC62008, Performance Characteristics and Calibration Methods for Digital Data Acquisition Systems and Relevant Software, first ed. 2005–2007, pp. 28–29.
4. IEC60748-4-3, Semiconductor Devices – Integrated Circuits – Part 4–3: Interface Integrated Circuits – Dynamic Criteria for Analogue-Digital Converters (ADC), first ed., 2006–2008, pp. 9–10.
5. ADC testing – Part 7 in a Series of Tutorials in Instrumentation and Measurements;Balestrieri;IEEE Instrum. Meas. Mag.,2006