A high sensitivity temperature coefficient of the Au/n-Si with (CdTe-PVA) structure based on capacitance/conductance-voltage (C/G-V) measurements in a wide range of temperature
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Published:2024-10
Issue:
Volume:238
Page:115316
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ISSN:0263-2241
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Container-title:Measurement
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language:en
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Short-container-title:Measurement
Author:
Erbilen Tanrıkulu Esra,
Güçlü Çiğdem Şükriye,
Altındal Şemsettin,
Durmuş HaziretORCID
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