Metrological evaluation of Microsoft Kinect and Asus Xtion sensors-Reference-Cited by-同舟云学术

Metrological evaluation of Microsoft Kinect and Asus Xtion sensors

Published:2013-07 Issue:6 Volume:46 Page:1800-1806
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Gonzalez-Jorge H.,Riveiro B.,Vazquez-Fernandez E.,Martínez-Sánchez J.,Arias P.

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference17 articles.

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4. Handbook of Optical and Laser Scanning,2004

5. Lateral resolution challenges for triangulation-based three-dimensional imaging systems;Mackinnon;Opt. Eng.,2012

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