Microscopic line-scan profilometer using zeroth-order fringe of a white light interference pattern-Reference-Cited by-同舟云学术

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Microscopic line-scan profilometer using zeroth-order fringe of a white light interference pattern

Published:2018-09 Issue: Volume:125 Page:254-256
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Lin Shyh-Tsong,Hsu Wei-Feng,Yeh Sheng-Lih,Shi Sheng-Wen

Funder

Ministry of Science and Technology, Taiwan, Republic of China

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference14 articles.

1. A low-cost laser distance sensor;Konolige,2008

2. 3D scanning system for digital dental based on line structured light sensor;Li,2012

3. Scanning freeform objects by combining shape from silhouette and shape from line structured light;Xiong;Proc. SPIE,2014

4. Embedded 3D vision measurement system based on the line structured light;Wang,2014

5. Embedded line scan image sensors: the low cost alternative for high speed imaging;Wolputte,2015

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Line-scanning technique using a PDMS grating in a microscope configuration;Applied Optics;2023-01-11

2. A novel chromatic confocal one-shot 3D measurement system based on DMD;Measurement;2021-12

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