Line-scanning technique using a PDMS grating in a microscope configuration

Abstract

We report the concept of a 1550 nm laser line scanning microscope based on a polydimethylsiloxane (PDMS) grating with scanning by stretching the PDMS grating to improve the scanning speed and enable low-cost scanning. Zemax is used to verify the possibility of realizing the system by simulating the illumination light path and the emission light path. The scanning field of view is 0.11 m m × 0.11 m m , and the modulation transfer function (MTF) data of the 0th, ± 1 st, and ± 2 nd diffraction orders in the illumination light path and the emission light path, respectively, meet the requirements of the diffraction limit resolution at the cutoff frequencies.