Four-point probe geometric correction factor for isotropic cylindrical samples with non-equal probe distances
Author:
Publisher
Elsevier BV
Subject
Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation
Reference26 articles.
1. R.A. Serway, Principles of Physics, Saunders College Publishing, London, 1998, p: 602.
2. Surface-sensitive conductivity measurement using a micro multi-point probe approach;Perkins;J Rev. Sci. Instrum.,2013
3. Accurate micro four-point probe sheet resistance measurements on small samples;Thorsteinsson;J Rev. Sci. Instrum.,2009
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5. An AC bridge for semiconductor resistivity measurements using a four-point probe;Logan;Bell Syst. Technol. J,1961
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