Sensitivity analysis with MC simulation for the failure rate evaluation and reliability assessment

Author:

Catelani M.,Ciani L.,Venzi M.

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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