A fault tolerant architecture to avoid the effects of Single Event Upset (SEU) in avionics applications

Author:

Ciani Lorenzo,Catelani Marcantonio

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference40 articles.

1. Investigation and Characterization of SEU Effects and Hardening Strategies in Avionics;Taber,1995

2. Development of a Semi-Empirical Model for SEUs in Modern DRAMs;Sarlese,2000

3. Terrestrial cosmic rays intensities;Ziegler;IBM J. Res. Develop.,1998

4. Altitude and latitude variations in avionics SEU and atmospheric neutron flux;Normand;IEEE Trans. Nucl. Sci.,1993

5. Cosmic ray effects on microelectronics;Adams;IEEE Trans. Nucl. Sci.,1982

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