Author:
Diethold C.,Kühnel M.,Hilbrunner F.,Fröhlich T.,Manske E.
Subject
Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation
Reference27 articles.
1. Atomic force microscope cantilever calibration device for quantified force metrology at micro- or nano-scale regime: the nano-force calibrator (NFC);Kim;Metrologia,2006
2. Si-traceable determination of spring constants of various atomic force microscope cantilevers with a small uncertainty of 1%;Kim;Meas. Sci. Technol.,2007
3. The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis;Clifford;Nanotechnology,2005
4. L. Doering, J. Frühauf, U. Brand, Micro force transfer standards, in: Proceedings of IMEKO 2002, TC3, TC5, TC22 Conference, Celle, Germany, 2002.
5. Piezoresistive cantilever as a portable micro force calibration standard;Behrens;J. Micromech. Microeng.,2003
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