Atomic force microscope cantilever calibration device for quantified force metrology at micro- or nano-scale regime: the nano force calibrator (NFC)
Author:
Publisher
IOP Publishing
Subject
General Engineering
Link
http://stacks.iop.org/0026-1394/43/i=5/a=008/pdf
Reference19 articles.
1. Nanoindentation hardness measurements using atomic force microscopy
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