Depth of origin of sputtered atoms for elemental targets
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference33 articles.
1. Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline Targets
2. Depth of origin and angular spectrum of sputtered atoms
3. New estimates of the characteristic depth of sputtering and of the bombardment-induced segregation ratio
4. P. Sigmund, M.T. Robinson, M.I. Baskes, M. Hautala, F.Z. Cui, W. Eckstein, Y. Yamamura, S. Hosaka, T. Ishitani, V.I. Shulga, D.E. Harrison, I.R. Chakarov, D.S. Karpuzov, E. Kawatoh, R. Shimizu, S. Valkealahti, R.M. Nieminen, G. Betz, W. Husinsky, M.H. Shapiro, M. Vicanek, H.M. Urbassek, Nucl. Instr. and Meth. 36 (1989) 110
5. Energy- and angle-resolved depth of origin of isotopes sputtered from an elemental target
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