IBIC analysis of high-power devices-Reference-Cited by-同舟云学术

IBIC analysis of high-power devices

Published:2001-07 Issue:1-4 Volume:181 Page:311-314
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Osipowicz T.,Zmeck M.,Watt F.,Fiege G.,Balk L.,Niedernostheide F.,Schulze H.-J.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference6 articles.

1. F.-J. Niedernostheide, H.-J. Schulze, J. Dorn, U. Kellner-Werdehausen, D. Westerholt, in: Proceedings of the 12th International Symposium on Power Semiconductors and IC's, ISPSD'2000, Toulouse, France, 2000, p. 267

2. Materials Analyses Using a Nuclear Microprobe;Breese,1996

3. The National University of Singapore nuclear microscope facility

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