Microprobe as implanter for semiconductor devices

Author:

Meijer J.,Stephan A.,Adamczewski J.,Röcken H.,Weidenmüller U.,Bukow H.H.,Rolfs C.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Single-Ion Implantation in Diamond with a High Lateral Resolution;Comprehensive Hard Materials;2014

2. Dark state photophysics of nitrogen–vacancy centres in diamond;New Journal of Physics;2012-12-04

3. Creation efficiency of nitrogen-vacancy centres in diamond;New Journal of Physics;2010-06-28

4. Towards the implanting of ions and positioning of nanoparticles with nm spatial resolution;Applied Physics A;2008-05-01

5. Estimation of keV submicron ion beam width using a knife-edge method;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-11

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