Author:
Vı́zkelethy György,Brunett Bruce A.,Walsh David S.,James Ralph B.,Olsen Richard W.,Doyle Barney L.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
11 articles.
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1. Sub-Micron Resolution of Localized Ion Beam Induced Charge Reduction in Silicon Detectors Damaged by Heavy Ions;IEEE Transactions on Nuclear Science;2015-12
2. Radiation Effects Microscopy;Characterization of Materials;2012-10-12
3. Cathodoluminescence and Spatial Variation in Mobility-Lifetime $(\mu \tau)$ Product in Bulk Doped Thallium Bromide;IEEE Transactions on Nuclear Science;2012-10
4. Ion beam induced charge imaging of charge transport in CdTe and CdZnTe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-04
5. A review of ion beam induced charge microscopy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-11