Electrostatic charging effects in fast H+ interactions with thin Ar films

Author:

Grosjean D.E,Baragiola R.A,Brown W.L

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Defect-induced electrostatic charging of nitrogen films;physica status solidi (b);2016-07-15

2. Charging effect and relaxation processes in electron bombarded cryogenic solids;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2012-04

3. Ion-induced electrostatic charging of ice at 15–160 K;Physical Review B;2012-01-17

4. Charging Effects in an Electron Bombarded Ar Matrix and the Role of Chemiluminescence-Driven Relaxation;The Journal of Physical Chemistry A;2011-05-23

5. Ion-induced electrostatic charging of ice;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-10

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