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Charging Effects in an Electron Bombarded Ar Matrix and the Role of Chemiluminescence-Driven Relaxation

  • Published:2011-05-23 Issue:25 Volume:115 Page:7258-7266
  • ISSN:1089-5639
  • Container-title:The Journal of Physical Chemistry A
  • language:en
  • Short-container-title:J. Phys. Chem. A

Author:

Savchenko Elena V.1,Khyzhniy Ivan V.1,Uyutnov Sergey A.1,Gumenchuk Galina B.2,Ponomaryov Alexey N.2,Beyer Martin K.3,Bondybey Vladimir E.2

Affiliation:

1. Institute for Low Temperature Physics and Engineering NASU, 61103 Kharkov, Ukraine

2. Department Chemie, Lehrstuhl 2 für Physikalische Chemie, Technische Universität München, Lichtenbergstrasse 4, 85747 Garching, Germany

3. Institut für Physikalische Chemie, Christian-Albrechts-Universität zu Kiel, Olshausenstrasse 40, 24098 Kiel, Germany

Publisher

American Chemical Society (ACS)

Subject

Physical and Theoretical Chemistry

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1. Desorption of excited H* atoms from free clusters Ar/CH4 and solid Ar doped with CH4;Low Temperature Physics;2021-12

2. Modeling of the thermal migration mechanisms of atomic oxygen in Ar, Kr, and Xe crystals;The Journal of Chemical Physics;2021-01-28

3. Defect-induced electrostatic charging of nitrogen films;physica status solidi (b);2016-07-15

4. Emission spectroscopy of solid nitrogen;Radiation Measurements;2016-07

5. Defect creation via dissociative recombination of ionic centers in solid Ne matrices;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-05
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