States ladder model for electrons backscattered in X-ray microanalysis. Application of the invariant embedding method-Reference-Cited by-同舟云学术

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States ladder model for electrons backscattered in X-ray microanalysis. Application of the invariant embedding method

Published:2000-02 Issue:2 Volume:160 Page:235-242
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Heluani S.P.,Hoffmann C.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference29 articles.

1. Radiative Transfer;Chandrasekhar,1960

2. Electron Microprobe Analysis;Reed,1993

3. R. Castaing, Thesis University of Paris, France, 1951

4. Recent progress in electron probe microanalysis

5. A versatile atomic number correction for electron-probe microanalysis

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1. The method of convergence to calculate particles fluxes in X rays spectrometry techniques. Application in nuclear compounds;Journal of Applied Physics;2012-12

2. Convergence method for calculating solutions to the 3D invariant embedding integro-differential equations describing electron transport processes;Journal of Materials Science;2010-05-18

3. 3D invariant embedding model for backscattering electrons applied to materials characterization;Physica B: Condensed Matter;2007-09

4. Invariant-embedding and cognate kinetic descriptions of particle reflection/emission from surfaces;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-03

5. Invariant embedding approach to microanalysis: Procedure to thin film characterization;Journal of Applied Physics;2006-02-15

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