Author:
Pereira J.A.M.,Bitensky I.S.,da Silveira E.F.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
8 articles.
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1. Mass spectrometric investigation of material sputtered under swift heavy ion bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-11
2. Secondary ion formation during electronic and nuclear sputtering of germanium;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-06
3. Secondary ion formation on indium under nuclear and electronic sputtering conditions;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2018-05
4. Enhancement of the secondary ion emission induced by fast clusters;Applied Surface Science;2009-03
5. A Theoretical and Experimental Study of Positive and Neutral LiF Clusters Produced by Fast Ion Impact on a Polycrystalline LiF Target;The Journal of Physical Chemistry A;2009-02-10