Accelerator SIMS at PSI/ETH Zurich-Reference-Cited by-同舟云学术

Accelerator SIMS at PSI/ETH Zurich

Published:1997-03 Issue:1-4 Volume:123 Page:575-578
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Ender R.M.,Döbeli M.,Suter M.,Synal H.-A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference8 articles.

1. Secondary ion mass spectrometry at close to single-atom concentration using DC accelerators

2. Accelerator SIMS for trace element detection

3. R.M. Ender, M. Döbeli, P.W. Nebiker, M. Suter, H.-A. Synal and D. Vetterli in: Proc. SIMS X, eds. A. Benninghoven et al. (Wiley, New York) in press.

4. Small-area depth profiling in a quadrupole based SIMS instrument

5. The heavy ion injector at the Zürich AMS facility

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1. Reprint Of: Enhanced spatially-resolved trace analysis using combined SIMS–single-stage AMS;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-01

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