Author:
Grabowski K.S.,Groopman E.E.,Fahey A.J.
Funder
Office of Naval Research
Naval Research Laboratory
Subject
Instrumentation,Nuclear and High Energy Physics
Reference19 articles.
1. Details of the measurement of rare earth and other trace element abundances by secondary ion mass spectrometry;Fahey;Int. J. Mass Spectrom.,1998
2. F.D. McDaniel, J.M. Anthony, J.F. Kirchhoff, D.K. Marble, Y.D. Kim, S.N. Renfrow, B.C. Grannan, E.R. Reznik, G. Vizkelethy, S. Matteson, Impurity determination in electronic materials by accelerator mass spectrometry, Nucl. Inst. Methods Phys. Res. B, 1994; 89, 242–249.
3. Accelerator SIMS at PSI/ETH Zurich;Ender;Nucl. Instrum. Methods Phys. Res. B,1997
4. Precious metal abundances in selected iron meteorites: in-situ AMS measurements of the six platinum-group elements plus gold;Wilson;Nucl. Instrum. Methods Phys. Res. B,1997
5. MegaSIMS: a SIMS/AMS hybrid for measurement of the Sun’s oxygen isotopic composition;Mao;Appl. Surf. Sci.,2008
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献