Author:
Bazzali A.,Borionetti G.,Orizio R.,Gambaro D.,Falster R.
Reference9 articles.
1. Falster, in B.O. Kolbesen, P. Stallhofer, C. Claeys, and F. Tartif (eds.), Proc. Satellite Symp. ESSDERC 93, Grenoble, France, 93(15), The Electrochemical Society, Pennington, NJ, 1993, p. 149.
2. The Gettering of Transition Metals by Oxygen‐Related Defects in Silicon
3. Gettering and Gettering Stability of Metals at Oxide Particles in Silicon
4. Gettering thresholds for transition metals by oxygen‐related defects in silicon
5. Investigation of oxide particles in Czochralski silicon heat treated for intrinsic gettering using scanning infrared microscopy