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Batch screening of commercial serial flash-memory integrated circuits for low-temperature applications

  • Published:2015-10 Issue: Volume:71 Page:39-46
  • ISSN:0011-2275
  • Container-title:Cryogenics
  • language:en
  • Short-container-title:Cryogenics

Author:

Ihmig Frank R.,Shirley Stephen G.,Zimmermann Heiko

Funder

State Chancellery of the federal state Saarland

Publisher

Elsevier BV

Subject

General Physics and Astronomy,General Materials Science

Reference29 articles.

1. Cold electronics: an overview;Kirschman;Cryogenics,1985

2. Low-temperature electronics;Kirschman;IEEE Circ Dev Mag,1990

3. Electronic memory devices for cryobiological applications;Ihmig,2004

4. Cryogenic electronic memory infrastructure for physically related continuity of care records of frozen cells;Ihmig;Cryogenics,2006

5. A large-scale cryoelectronic system for biological sample banking;Shirley;Cryogenics,2009

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1. Cryogenic Si/SiGe Heterostructure Flash Memory Devices;ACS Applied Electronic Materials;2022-06-15

2. Shear performance of microscale ball grid array structure Cu(Ni)/Sn–3.0Ag–0.5Cu/Cu(Ni) solder joints at low temperatures;Materials Today Communications;2022-03

3. Cryogenic Operation of 3-D Flash Memory for Storage Performance Improvement and Bit Cost Scaling;IEEE Journal on Exploratory Solid-State Computational Devices and Circuits;2021-12

4. Size effect on tensile performance of microscale Cu/Sn3.0Ag0.5Cu/Cu joints at low temperatures;Journal of Materials Science: Materials in Electronics;2021-10-26

5. Multi-bit cryogenic flash memory on Si/SiGe and Ge/GeSi heterostructures;2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA);2021-04-19
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