1. EEE-INST-002, “Instructions for EEE Parts Selection, Screening, Qualification, and Derating,” published by NASA Goddard Space Flight Center. .
2. MIL-STD-750 Rev E, “Test Method Standard, Test Methods for Semiconductor devices,” 20 Nov 2006. .
3. MIL-STD-883, Rev H, “Test Method Standard, Microcircuits,” 2/26/2010. .
4. MIL-STD-202, Rev G, “Test Method Standard, Electronic and Electrical Component Parts,” 2/8/2002. .
5. Lake Shore Cryotronics, Inc., Westerville, OH, USA.