RHEED study of thin tin films grown at deposition rates of 2 to 10 Å/s-Reference-Cited by-同舟云学术

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RHEED study of thin tin films grown at deposition rates of 2 to 10 Å/s

Published:1989-06 Issue:2 Volume:96 Page:413-418
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Tsukeva E.A.,Djuneva K.D.,Peneva S.K.,Sevov S.H.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference20 articles.

1. The Structure of Tin Thin Films Evaporated onto a Clean NaCl Substrate

2. The effect of low-pressure oxygen, present during condensation, on the structure of tin films

3. Abnormal reflections in electron-diffraction patterns from tin condensed in low-pressure air or oxygen

4. An analysis of the residual strains in epitaxial tin films

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electrochemically obtained tin – Part I;Zeitschrift für Kristallographie - Crystalline Materials;1992-02-01

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