An analysis of the residual strains in epitaxial tin films-Reference-Cited by-同舟云学术

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An analysis of the residual strains in epitaxial tin films

Published:1969-06 Issue:162 Volume:19 Page:1127-1139
ISSN:0031-8086
Container-title:Philosophical Magazine
language:en
Short-container-title:Philosophical Magazine

Author:

Vincent R.

Publisher

Informa UK Limited

Link

http://www.tandfonline.com/doi/pdf/10.1080/14786436908228639

Reference21 articles.

1. Deviations from stoichiometry and electrical properties in SnTe

2. Partial Pressures in Equilibrium with Group IV Tellurides. II. Tin Telluride

3. Brooks, H. 1952.Metal Interfaces, 20Cleveland: American Society for Metals.

4. Reproducible preparation of Sn1−xPbxTe epitaxial films with moderate carrier concentrations

5. The equilibrium of crystal surfaces

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